ACM International Conference on Computing Frontiers May 5 - 7, 2008 Ischia, Italy

CALL-FOR-PAPERS Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies The Technology Roadmap for Semiconductors (ITRS) has identified that beyond 90nm CMOS technology soft errors severely impact field-level product reliability, not only for embedded memory, but for logic as well. Soft errors are upsets with transient effects that can occur in integrated circuits due to the interaction of energetic particles with the circuit substrate. The goal of this half-day workshop is to present the latest research on radiation effects and fault tolerance strategies to provide reliability in nanometer technologies. This includes work on modeling, testing and design at device, circuit and system level.

Paper Submission and Publication All accepted papers for the Workshop will be included in the Computing Frontiers Conference Proceedings published by ACM. Submission deadline: February 10^th, 2008 Author notification: February 25^th, 2008 Manuscript Deadline: March 5^th, 2008 Submission Guidelines: Up to 12 pages in length Single column Double spaced Please send your workshop paper manuscript in pdf format to Fernanda Lima Kastensmidt: fglima@inf.ufrgs.br. More information at: http://www.computingfrontiers.org/ sponsored by ACM, SIGMICRO and IBM Research

Topics Suggested topics, but are not limited to: · Radiation effects in nanometer technologies · Characterization and Modeling of soft errors in integrated circuits · Soft error vulnerability in architectures and applications · Soft error detection/tolerance techniques for architectures and applications · Application/circuit-specific error detection/correction algorithms · Security implications of ambient and malicious soft errors (malicious = under heating lamp/neutron beam) · On-line monitoring of current, temperature and other reliability indicators · System-on-Chip (SoC): computation on many unreliable cores · Network-on-Chips (NoC): reliability on hash environments · Reconfigurable Computing for fault tolerance · Fault tolerance techniques for Field Programmable Gate Arrays (FPGAs) Workshop Organizers Fernanda Lima Kastensmidt Universidade Federal do Rio Grande do Sul, Brazil fglima@inf.ufrgs.br Greg Bronevetsky Lawrence Livermore National Lab, USA bronevetsky1@llnl.gov Program Committee Christian Engelmann, Oak Ridge National Laboratory, USA George Ostrouchov, Oak Ridge National Laboratory, USA Hugh Barnaby, Arizona State University, USA Lorena Anghel, Institut Polytechnique de Grenoble, France Massimo Violante, Politecnico di Torino, Italy Manuel Gericota, Instituto Superior de Engenharia do Porto, Portugal Subhasish Mitra, Stanford University, USA Ricardo Reis, UFRGS, Brazil Gilson Wirth, UFRGS, Brazil Monica Alderighi, INAF, Italy